Semiconductor Material Analysis

Understanding the composition and properties of semiconductor materials is essential for ensuring quality and performance. We offer a range of advanced material analysis techniques to examine semiconductor materials at atomic and molecular levels. From atomic force microscopy to dynamic secondary ion mass spectrometry, our services provide detailed information to support your material characterization needs.

Ensure the quality and performance of your semiconductor materials

We enable you to:

Gain detailed insights

Utilize advanced material analysis techniques to examine semiconductor materials at the atomic and molecular levels.

Identify material composition

Determine the composition and properties of semiconductor materials with precision and accuracy.

Enhance product development

Use insights from material analysis to improve the quality and performance of your semiconductor products.

Discover our range of semiconductor material analysis services

We offer a comprehensive range of semiconductor material analysis services, including:

• Atomic Force Microscope (AFM)
• Field Emission Scanning Electron Microscope (FESEM)
• Transmission Electron Microscope (TEM)
• Electron MicroProbe Analysis (EPMA)
• Energy Dispersive X-Ray Spectroscopy (EDX)
• X-ray Photoelectron Spectroscopy (XPS)
• Auger Electron Spectroscopy (AES)
• Secondary Ion Mass Spectrometry (SIMS)
• Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
• Fourier Transform Infrared Spectroscopy (FT-IR)
• X-ray Diffraction (XRD)
• Spreading Resistance Profile (SRP)
• Dynamic Secondary Ion Mass Spectrometry (D-SIMS)